6

Smoking in schizophrenia

Year:
2019
Language:
english
File:
PDF, 297 KB
english, 2019
14

Oxygen precipitation in silicon

Year:
1995
Language:
english
File:
PDF, 10.60 MB
english, 1995
15

Infrared study of oxygen precipitate composition in silicon

Year:
1992
Language:
english
File:
PDF, 248 KB
english, 1992
19

Reconstructed graphene nanoribbon as a sensor for nitrogenbased molecules

Year:
2015
Language:
english
File:
PDF, 1.71 MB
english, 2015
22

The serotonergic system and cognitive function

Year:
2016
Language:
english
File:
PDF, 173 KB
english, 2016
27

Oxygen precipitates in short-time annealed Czochralski silicon

Year:
1993
Language:
english
File:
PDF, 653 KB
english, 1993
28

Radiation effects on porous silicon

Year:
1993
Language:
english
File:
PDF, 276 KB
english, 1993
29

Climatic predispositions of Yugoslavia for solar energy application

Year:
1983
Language:
english
File:
PDF, 635 KB
english, 1983
32

Stoichiometry of oxygen precipitates in silicon

Year:
1993
Language:
english
File:
PDF, 250 KB
english, 1993
33

XRR and GISAXS study of silicon oxynitride films

Year:
2006
Language:
english
File:
PDF, 618 KB
english, 2006
34

X-ray reflectivity study of hydrogen implanted silicon

Year:
2006
Language:
english
File:
PDF, 193 KB
english, 2006
35

Raman study of carbon clusters in W–C thin films

Year:
2005
Language:
english
File:
PDF, 249 KB
english, 2005
40

Non-doping light impurities in silicon for solar cells

Year:
1996
Language:
english
File:
PDF, 791 KB
english, 1996
41

Surface mode excitation in platelet SiOx precipitates in silicon

Year:
1996
Language:
english
File:
PDF, 330 KB
english, 1996
42

Pulsed laser ablation of GaAs using nano pulse length

Year:
2011
Language:
english
File:
PDF, 771 KB
english, 2011
48

A GISAXS study of SiO/SiO2 superlattice

Year:
2006
Language:
english
File:
PDF, 725 KB
english, 2006
49

Self-organized growth of Ge islands on Si(100) substrates

Year:
2006
Language:
english
File:
PDF, 277 KB
english, 2006
50

GISAXS study of Si nanocrystals formation in SiO2 thin films

Year:
2006
Language:
english
File:
PDF, 241 KB
english, 2006